Revolutionary True 3D In-line Dispensing Process Inspection (DPI) with a Thickness Measurement Solution based on Patented Technologies
Revolutionary True 3D In-line Dispensing Process Inspection (DPI) with a Thickness Measurement Solution based on Patented Technologies. Most optical systems use UV light to inspect the surface for presence and gauges to measure material thickness in a particular spot, which does not provide the accuracy and repeatability needed. Inspecting transparent materials proved to be a challenge due to the laser’s shallow penetration depth and elapsed time. Traditional laser-confocal or electron microscope systems measure three-dimensional shapes. Koh Young’s revolutionary Neptune C+ provides the ultimate solution to these challenges.
Award-winning 3D Dispensing Process Inspection (DPI) Solutions for Transparent Materials
he Neptune C+ is the industry’s first 3D in-line DPI and thickness measurement solution for transparent material inspection. The system allows manufacturers to explore the depths of its process and accurately identify defects with 2D, 3D, and cross-section views. The system accurately measures materials for coverage, thickness, and consistency with user-defined threshold settings. It also inspects bubbles and other defects as small as 200-microns, even inspecting “keep out” areas for 100-micron splash marks.
Explore the Depths of Your Process
The Neptune Series handles several types of applications spanning research labs to inline electronics inspection across North and South America. By equipping your facility with our 3D inspection system, you can perform more accurate quality control tests and cut costs as a result.