Koh Young's specialized technology solutions offer the semiconductor sector the precision, efficiency, and reliability needed to meet the high standards of semiconductor manufacturing.

Semiconductor Inspection Solutions

Koh Young Technology provides indispensable support to the semiconductor sector through a suite of advanced inspection and measurement solutions, addressing the unique challenges of semiconductor manufacturing. With a focus on precision, efficiency, and reliability, Koh Young’s technologies cater to the critical aspects of semiconductor production.


Koh Young’s Semiconductor Inspection technology is tailored for wafer and die inspection, detecting even the smallest irregularities to maintain the integrity of semiconductors at the foundational level. Complementing these inspection solutions, Koh Young’s Smart Factory Solutions embrace Industry 4.0 advancements, optimizing semiconductor manufacturing through data analytics, AI, and automation.

Achieving Unparalleled Accuracy with AOI

In the semiconductor sector, where the smallest defect can have significant consequences, Koh Young’s Automated Optical Inspection (AOI) technology ensures the highest levels of precision and quality control.

Specialized for semiconductor applications, AOI identifies defects at the micro level, including misalignments, solder defects, and more, critical for the functionality of semiconductor devices. This precision supports the sector’s demand for flawless production, vital for the reliability of electronic devices across all industries.

Ensuring Consistency in Critical Coatings and Adhesives

The application of materials like adhesives, underfills, and coatings is crucial in semiconductor assembly. Koh Young’s Dispense Process Inspection (DPI) technology guarantees the accuracy and uniformity of these applications, preventing issues that could compromise device integrity.

DPI’s precise control over the dispensing process plays a significant role in enhancing the durability and performance of semiconductor products.

Micro-Level Defect Detection for Optimal Performance

Koh Young’s Semiconductor Inspection technology is specifically designed to address the unique challenges of wafer and die inspection. This includes detecting defects, irregularities, and contamination at the wafer level, ensuring that only the highest quality semiconductors proceed through the manufacturing process.

This level of inspection is crucial for maintaining the integrity and performance of semiconductors, underpinning the quality of electronic products globally.

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Each of these applications demonstrates Koh Young America’s commitment to innovation and quality, providing industries with the tools they need to achieve excellence in manufacturing, ensure product reliability, and maintain competitive advantages in their respective markets.